Western Digital Corporation ACRONYMS
Last Update: May 30, 2001
1394 IEEE Standard for a High Performance Serial Bus ABA Absolute Block Address MSB(CYL HI) MB(CYL LO) LSB(SEC #) ABCD Burst Servo info embedded in data tracks AC Abort Command AFT AFXMT Advanced Architecture Surface Formatter Ambient Room Air Temperature ±3° C. API AT PCI Interface card API Application Program Interface ARCO Advanced Read Channel Optimization ASCO Advanced Servo Channel Optimization ASPT Advanced Single Plug Tester (Advanced Single Plug backend) AST Application Specific Test, embedded SW running on SDC card ATA AT Attachment Bad Block RBBlist marks a block as bad BBD Bad Block detected BPI Bits per inch BOM Bill Of Materials BUE Calibrate Table of mag field strength vs.head location across full stroke CC Cell Controller, system application used to monitor drive’s test inside SPT CCC Cell Controller Configuration CCS Channel Characterization Station CEU Command Execution Unit CHS Cylinder, Head, Sector CORR Data was Corrected CIA Command Index Array CIM Computer Integrated Manufacturing, a type of data collection system Cluster Number of cylinders a head crosses before doing a head switch CPM Customer program metrics CPRT CSD Cache Segment Descriptor DAM Data Address Mark DAMNF Data Address Mark Not Found DASP Drive Active/Slave Present DCM Drive Configuration Matrix DCT Drive Configuration Table (RAM image of config sector) DFP Drive failure protection DMA Direct memory access DMS Document Management System DPPM Defective parts per million? DRDY Drive not Ready error DRM Drive Reliability Monitor DRQ IDE signal DSC Drive Seek Complete error DSFIS Drive Shop Floor Interface System DST Drive Self Test DTR Data transfer rate DUT Drive Under Test DWF Drive Write Fault DVT Drive Validation Test DX Disk Controller EAR Engineering Action Request EB Engineering Bulletin EC ECC Error Correction Code ECO Engineering Change Order EFT EIDE Enhanced Integrated Drive Interface EL Event Log EPM Engineering program management EPU Error Processing Unit ERR Error bit in status EVT Engineering Verification Testing FA FCI Flux changes per inch FCS Final Configuration Station FDP Firmware Development Process FIMMS Factory Integrated Manufacturing Management System, a type of data collection system FIN FIT Functional Integrity Test FMEA FPC Fixture Personality Card FQA Final Quality Audit FQA Final Quality Assurance FQT FROT Field Reliability Ongoing Test FSM Frame Sync Mark FTA FTC Controller Firmware Engineering Verification Test FTS Final Test Station/System FW Firmware G list Grown defect list (set to empty by FTS) GRR HALT Highly Accelerated Test HAM Host automation Module HDA Head Disk Assembly (sans PCBA) HDD Hard Disk Drive HDS High Density Servo HIB HOST SW Application used to configure and dispatch files for CC and AST use HSDT Hard Sector Descriptor Table HSSM Hard Sector State Machine HVM IBI Intelligent Burn IN IBI Logs ID Inner Diameter IDC Intelligent Drive Controller ( 1 Micro Processor Per Slot ) IDE Integrated drive Electronics IDM Intelligent defect Margining (scratch handling) IDNF ID Not Found (LBA error) IDO Initial Drive Optimization IDS1 Interconnect Data Server IDT Initial Drive Test (SPT) IEC International Electrical Committee IMP IBI Monitoring Program IMRD Marketing requirement doc ITR Issue Tracking Report KFCI Kilo Flux Change per Inch LBA Logical Block Address LOB Line of business LOH Labor overhead LOETHE Low end of the high end LT Log Tools LTR Lock to Reference LVD Low voltage differential (SCSI) MCAL Magnetic Calibration Data MD Middle Diameter MDOS Multi-Tasking Drive Operating System MMS Margin Monitoring System, a type of data, contains drive processing status MPU Micro-Processor Unit MR Master revision MRI Magneto Resistive head Instability MSDR MTBF Mean time between failures MTTR Mean time to repair Native Mode Diagnostic mode Nonoperating Drive power off Nonrepeatable Error Data, ID, or framing error that doesn't recur when command is immediately repeated NPI NRRO Non Repeatable Run Out NRZ Non return to zero OD Outer Diameter OEM Original equipment manufacturer Operating Power on spin up, calibration complete (drive ready) ORT Ongoing Reliability Test OTP One Time Programmable PAM P list Primary defect list (IBI) PD list Push Down list PERCO PRML Enhanced Read Channel Optimization PES Position Error Signal PIO Processor input/output PM Program manager PMM Program manager meetings POR Power On Reset POST Power-on self test PRD Product specifications/requirements document PSG Personal storage group QRD Quality requirement document QVT Quality Verification Test RBB list Relocated and bad block list RCC Rack Controller Card (Xyratex) RCF Reconfiguration RDT Recalibrate Heads moved to track 0 Recoverable Error Data, ID, or framing error is recovered when host retries are enabled Repeatable Error Recurs on repeated command RLL Run length limited ROI Return on investment RPD list Reserved cylinders push down list RRC ROM Resident Code RRO Repeatable Run Out RSC Rescreen RT list Relocated Track list RVT Reliability verification test RWC Read write current RWCCS Read Write Channel Characterization Station RWE Read Write error rate SAM Error SBC Serial Bus Controller SBW Single Block Write Scan Out Serial number mismatch check SCT Sequence Control Table SDC Smart Drive Controller, 12 SDC card inside one SPT, each SDC card controls five drives SDH Select Drive and Head number register SE SECBITMAP Sector to Bitmap table SFDM SNR Signal to Noise Ratio Spare Sector Area At Inner Diameter of drive SPC Statistical Process Control, a type of data contains Servo Writer Status SPT Single Plug Test or Sectors per Track SRA Schedule risk assessment SRE System reliability engineering SRF Software Release Form STW Servo Track Writer TA Thermal Asperity (MR heads read bump friction heat as signal) TAA Track Average Amplitude TARE Transparent Auto Relocation TBMT Track Bit Map Table TD list Track descriptor list TE Test Engineering TMR Track misregistration TOC Time Offset Count (locates data following wedge) TOL TPI Tracks per inch TPM Technical program metrics Translate mode Seen by end-user TRL Test requirements list TRN Test Release Notice TSC Technical Screen TTM Time to market uJog HandlesThin Film Read and MR write elements offset UNC Uncorrectable data error Unrecoverable Error Host retries fail UTV UUT Unit Under Test VCM Voice coil motor WCT Writable Control Store (on host) Wedge Holds header and position data Window Block of counters enabled by a specific event x-skew Handled by surface format XTTF XYRATEX Company that provides SPT tester chamber and related SW y-skew Handled by servo offset during read (uJog) (HSDT) ZHS Zoned Head Switch |